发明名称 |
METHOD OF DRIVING MOVABLE BODY, SYSTEM OF DRIVING MOVABLE BODY, PATTERN FORMATION METHOD AND DEVICE, EXPOSURE METHOD AND DEVICE, DEVICE MANUFACTURING METHOD, MEASUREMENT METHOD, AND POSITION MEASUREMENT SYSTEM |
摘要 |
<P>PROBLEM TO BE SOLVED: To stably and highly accurately drive a movable body by measuring an installation position of a surface position sensor and measuring position coordinates in a vertical direction and an inclination direction of a two-dimensional movement surface of the movable body using the surface position sensor on the basis of the measured installation position. <P>SOLUTION: A wafer stage WST is moved while an XY position of the wafer stage WST is monitored using an interferometer system, and an XY installation position of a surface position sensor is measured by scanning Y scales 39Y<SB POS="POST">3</SB>and 39Y<SB POS="POST">4</SB>in X-axis direction and Y-axis direction using the surface position sensor 72<SB POS="POST">k</SB>, 74<SB POS="POST">i</SB>, 76<SB POS="POST">j</SB>. The wafer stages is stably and highly accurately driven by measuring position coordinates of the wafer stage against an XY plane (a movement surface) in a vertical direction and an inclination direction using the surface position sensor on the basis of obtained installation position information. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013034004(A) |
申请公布日期 |
2013.02.14 |
申请号 |
JP20120237750 |
申请日期 |
2012.10.29 |
申请人 |
NIKON CORP |
发明人 |
SHIBAZAKI YUICHI;KANATANI YUHO |
分类号 |
H01L21/027;G01B11/00 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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