发明名称 Methods of Forming Semiconductor Devices Having Narrow Conductive Line Patterns
摘要 Semiconductor devices and methods of forming semiconductor devices are provided in which a plurality of patterns are simultaneously formed to have different widths and the pattern densities of some regions are increased using double patterning. The semiconductor device includes a plurality of conductive lines each including a first line portion and a second line portion, where the first line portion extends on a substrate in a first direction, the second line portion extends from one end of the first line portion in a second direction, and the first direction is different from the second direction; a plurality of contact pads each of which is connected with a respective conductive line of the plurality of conductive lines via the second line portion of the corresponding conductive line; and a plurality of dummy conductive lines each including a first dummy portion extending from a respective contact pad of the plurality of contact pads, in parallel with the corresponding second line portion in the second direction.
申请公布号 US2013040452(A1) 申请公布日期 2013.02.14
申请号 US201213652550 申请日期 2012.10.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK YOUNG-JU;MIN JAE-HO;KIM MYEONG-CHEOL;KIM DONG-CHAN;SIM JAE-HWANG
分类号 H01L21/28;H01L21/311 主分类号 H01L21/28
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