发明名称 METHOD AND SYSTEM FOR CHARACTERIZING EFFICIENCY IMPACT OF INTERRUPTION DEFECTS IN PHOTOVOLTAIC CELLS
摘要 <p>A system for characterizing interruption defect induced efficiency loss in a photovoltaic cell includes an inspection system configured to acquire inspection data from a photovoltaic cell, a control system configured to: receive the inspection data acquired from the photovoltaic cell, identify one or more interruption defects in one or more fingers of an electrode of the one photovoltaic cell utilizing the inspection data, determine a spatial parameter associated with at least one of the identified interruption defects and one or more floating finger portions of the one or more fingers created by two or more identified interruption defects, determine an interruption-defect-induced efficiency loss of the photovoltaic cell based on the determined spatial parameter associated with the at least one of the identified interruption defects and the floating finger portions of the one or more fingers created by two or more identified interruption defects.</p>
申请公布号 WO2013022711(A1) 申请公布日期 2013.02.14
申请号 WO2012US49360 申请日期 2012.08.02
申请人 KLA-TENCOR CORPORATION;HOO, CHOON HOONG (GEORGE);PAK, PATRICK TUNG-SING;CHANG, CHOON WAI;VANROSSEN, KRISTIAAN;DEGREEVE, JOHAN;GOVAERTS, LIEVE;YIN, JIA-JIE PATRICK 发明人 HOO, CHOON HOONG (GEORGE);PAK, PATRICK TUNG-SING;CHANG, CHOON WAI;VANROSSEN, KRISTIAAN;DEGREEVE, JOHAN;GOVAERTS, LIEVE;YIN, JIA-JIE PATRICK
分类号 G01R31/26;H01L31/042;H01L31/18 主分类号 G01R31/26
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