发明名称 METHOD FOR FABRICATING A DAMASCENE SELF-ALIGNED FERROELECTRIC RANDOM ACCESS MEMORY (F-RAM) DEVICE STRUCTURE EMPLOYING REDUCED PROCESSING STEPS
摘要 Disclosed is a novel non-volatile, ferroelectric random access memory (F-RAM) device and a method for fabricating a damascene self-aligned F-RAM device structure on a planar surface using a reduced number of masks and etching steps.
申请公布号 US2013037897(A1) 申请公布日期 2013.02.14
申请号 US201213569735 申请日期 2012.08.08
申请人 RAMTRON INTERNATIONAL CORPORATION;SUN SHAN;DAVENPORT THOMAS E.;CRONIN JOHN 发明人 SUN SHAN;DAVENPORT THOMAS E.;CRONIN JOHN
分类号 H01L21/02;H01L29/82 主分类号 H01L21/02
代理机构 代理人
主权项
地址