发明名称 SCANNING PROBE MICROSCOPE AND METHOD FOR DETECTING ION IN SOLUTION USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a scanning probe microscope capable of analyzing ions eluted into a solution from a sample, and a method for detecting the ions in the solution using the scanning prove microscope. <P>SOLUTION: A scanning prove microscope having an electrochemical cell 5 in which a sample 1, a reference electrode 2, a counter electrode 3, and a prove 4 are disposed in a solution, for measuring a rugged shape of a sample surface using the prove 4, comprises: prove potential control means (7, 8 and 100) for variably controlling electric potential of the prove 4 with respect to the reference electrode 2; and current detection means for detecting a prove current flowing in the prove by an electrochemical reaction between the prove 4 and the counter electrode 3 under variably controlled prove potential. The scanning prove microscope identifies a potential range in which ions existing in the solution are caught by the probe 4 to indicate an oxidation or reduction reaction, from the probe potential and the probe current, to identify and quantitate the ions in the solution. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013033003(A) 申请公布日期 2013.02.14
申请号 JP20110169902 申请日期 2011.08.03
申请人 HITACHI LTD 发明人 HONBO MICHIKO
分类号 G01Q60/60;G01Q30/14 主分类号 G01Q60/60
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