Device for testing integrated circuit, has test sequence provider that provides different test bit sequences of test circuit based on error correction code indicated in coded binary word

摘要

The device (100) has a syndrome tester (110) that determines the mistake bit sequence based on coded binary word. A test sequence provider (120) provides different test bit sequences of the test circuit (102) based on the error correction code indicated in the coded binary word. An evaluation circuit (130) detects faulty processing of test bit sequence by the circuit to be tested based on the test bit sequence test output signal of the test circuit. Independent claims are included for the following: (1) method for testing circuit; and (2) computer program for testing circuit.