发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD, SEMICONDUCTOR DEVICE, AND JIG FOR FORMING WIRING
摘要 <p>This semiconductor device manufacturing method has: a first step, wherein a pair of penetrating electrodes that penetrate a substrate in the thickness direction, and a pair of vertical electrodes connected to one surface of the substrate by being extended in the substrate in the thickness direction are formed, and common wiring that connects the pair of vertical electrodes to a device layer on the substrate is formed; a second step, wherein connecting wiring is formed, said connecting wiring connecting with each other one penetrating electrode out of the pair of penetrating electrodes, and one vertical electrode out of the pair of vertical electrodes; and a third step, wherein substrates respectively having the device layers formed thereon are laminated, and the penetrating electrodes of one substrate and the penetrating electrode having no connecting wiring connected thereto out of the pair of penetrating electrodes of the other substrate are connected to each other, said the other substrate being laminated to face the one substrate.</p>
申请公布号 WO2013021847(A1) 申请公布日期 2013.02.14
申请号 WO2012JP69319 申请日期 2012.07.30
申请人 TOKYO ELECTRON LIMITED;IWATSU, HARUO;MATSUMOTO, TOSHIYUKI 发明人 IWATSU, HARUO;MATSUMOTO, TOSHIYUKI
分类号 H01L27/10;H01L21/3205;H01L21/768;H01L23/522;H01L25/065;H01L25/07;H01L25/18;H01L27/00 主分类号 H01L27/10
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