发明名称 INTEGRATED CIRCUIT, IMAGE FORMATION DEVICE AND INTEGRATED CIRCUIT INSPECTION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To inexpensively and adequately evaluate an integrated circuit such as ASIC, while reducing a man-hour with an element. <P>SOLUTION: As for an engine ASIC 11, when a test mode is set on an operation mode changeover register 39, an S2M image processing module 31 executes an image process with respect to image data input from a scanner 5 based on a line synchronization signal s_lsync_n and a frame effective signal s_fgate_n, and WDMAC 33a-33d store the image data in a buffer control part 38 through an arbiter 35 for write and a read data selector (R_SEL) 40, and RDMAC 34a-34d read the image data of the buffer control part 38 through an arbiter 36 for read and a read data selector (R_SEL) 41 to transmit them to an M2P image processing module 32. The M2P image processing module 32 executes the image process with respect to the image data to output it to a plotter 6. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013033323(A) 申请公布日期 2013.02.14
申请号 JP20110168091 申请日期 2011.08.01
申请人 RICOH CO LTD 发明人 NAGAI AKIRA
分类号 G06F11/22;G03G21/00 主分类号 G06F11/22
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