发明名称 METHODS FOR ATOMIC LAYER DEPOSITION
摘要 A method of depositing a thin film by atomic layer deposition (ALD) on a substrate surface is disclosed. The disclosed method includes placing an ALD deposition proximity head above the substrate with at least one gas channel configured to dispense a gas to an active process region of the substrate surface. The ALD deposition proximity head extends over and is being spaced apart from the active process region of the substrate surface when present. After a pulse of a first reactant gas is dispensed on the active process region of the substrate surface underneath the proximity head, a pulse of a second reactant gas is dispensed on the active process region of the substrate surface underneath the proximity head to react with the first reactant gas to form a portion of the thin layer of ALD film on the surface of substrate underneath the proximity head.
申请公布号 US2013040460(A1) 申请公布日期 2013.02.14
申请号 US201213605926 申请日期 2012.09.06
申请人 LAM RESEARCH CORPORATION;YOON HYUNGSUK ALEXANDER;KOROLIK MIKHAIL;REDEKER FRITZ C.;BOYD JOHN M.;DORDI YEZDI 发明人 YOON HYUNGSUK ALEXANDER;KOROLIK MIKHAIL;REDEKER FRITZ C.;BOYD JOHN M.;DORDI YEZDI
分类号 H01L21/768;H01L21/4763 主分类号 H01L21/768
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