The present invention provides a method of analysing a sample comprising sub-micron particles, comprising determining first information about the size of particles and number of particles in the sample by nanoparticle tracking analysis;determining second information about average particle size of particles in the sample by dynamic light scattering;determining from the first information third information representing the theoretical effect of the detected particles on results obtainable by dynamic light scattering; and adjusting the second information using the third information to produce fourth information representing adjusted information on average particle size.
申请公布号
WO2013021185(A1)
申请公布日期
2013.02.14
申请号
WO2012GB51899
申请日期
2012.08.06
申请人
NANOSIGHT LIMITED;CARR, ROBERT JEFFREY GEDDES;HOLE, JOHN PATRICK;SMITH, JONATHAN BENJAMIN KENDALL
发明人
CARR, ROBERT JEFFREY GEDDES;HOLE, JOHN PATRICK;SMITH, JONATHAN BENJAMIN KENDALL