发明名称 Semiconductor device, method for testing same and transmitting circuit
摘要 According to an embodiment, a semiconductor device includes an analog/digital conversion unit (3), a pulse width modulation unit (5) outputting a transmission signal, the transmission signal being a pulse pattern corresponding to a digital signal output from the analog/digital conversion unit (3), a reference signal generation unit (7) generating a reference signal, the reference signal being a fixed pulse pattern. The device includes a first control unit (13) selecting one of the transmission signal and the reference signal, a light emitting element drive unit (9) outputting a drive current based on the transmission signal or the reference signal, a light emitting element (15) driven by the light emitting element drive unit (9). The device includes an optical receiving unit (21) converting the optical signal into a voltage signal, and a demodulation unit (25) demodulating the voltage signal into a digital signal based on the transmission signal or the reference signal.
申请公布号 EP2557703(A1) 申请公布日期 2013.02.13
申请号 EP20120160567 申请日期 2012.03.21
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 UO, TOYOAKI
分类号 H04B10/00 主分类号 H04B10/00
代理机构 代理人
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