发明名称 METHOD OF FORMING FINE PATTERNS FOR SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A method for forming a fine pattern of a semiconductor device is provided to simplify a manufacturing process by removing a mask layer with poly silicon to reduce the number of mask layers. CONSTITUTION: An etched layer(210) and a hard mask layer(220) are formed on a substrate(200). A carbon containing film is formed on the hard mask layer. A carbon containing film pattern(230a) is formed by etching the carbon containing film. A spacer mask layer(260) including silicon nitride is formed on the carbon containing film pattern. A spacer is formed to cover the sidewalls of the carbon containing film pattern. A hard mask pattern is formed by etching the hard mask layer using the spacer as an etch mask.</p>
申请公布号 KR20130015145(A) 申请公布日期 2013.02.13
申请号 KR20110076992 申请日期 2011.08.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHUNG, BYUNG HONG;YOO, CHA YOUNG;KIM, DONG HYUN
分类号 H01L21/027;H01L21/8239 主分类号 H01L21/027
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