| 摘要 |
PURPOSE: A method and apparatus for testing a semiconductor memory device are provided to improve test efficiency by setting a transmission authority of a test result information packet of each test unit using the circulation of a token signal. CONSTITUTION: An integrated controller(320) controls the circulation of a token signal and determines a test finish point. A plurality of test units inputs a test pattern to a corresponding memory and generates a test result information packet by comparing the output of a memory. A token signal bus(350) and a data signal bus(340) connect the plurality of the test units to the integrated controller with a ring network type. [Reference numerals] (310) External test device; (320) Integrated controller; (321, 333, CC) Packet generator; (322) Data analyzer; (323, 331, BB) Controller; (330) First test unit; (334, DD) Fault diagnosis information storing buffer; (335, EE) Memory test pattern generator & memory output comparator; (AA) N-th test unit; (FF) Memory 0; (GG) Memory n |
