发明名称 Resistive memory using SiGe material
摘要 A resistive memory device includes a first electrode; a second electrode having a polycrystalline semiconductor layer that includes silicon; a non-crystalline silicon structure provided between the first electrode and the second electrode. The first electrode, second electrode and non-crystalline silicon structure define a two-terminal resistive memory cell.
申请公布号 US8374018(B2) 申请公布日期 2013.02.12
申请号 US20100833898 申请日期 2010.07.09
申请人 CROSSBAR, INC.;LU WEI 发明人 LU WEI
分类号 G11C11/00;H01L47/00 主分类号 G11C11/00
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