发明名称 Plasma oxidation processing method, plasma processing apparatus and storage medium
摘要 A silicon oxide film is formed in a processing chamber of a plasma processing apparatus by performing oxidation process, by using plasma to a processing object having a patterned irregularity, wherein the plasma is generated while high-frequency power is supplied to a mount table under the conditions that the oxygen content in a process gas is not less than 0.5% and less than 10% and the process pressure is 1.3 to 665 Pa.
申请公布号 US8372761(B2) 申请公布日期 2013.02.12
申请号 US20080594078 申请日期 2008.03.28
申请人 TOKYO ELECTRON LIMITED;KABE YOSHIRO;KOBAYASHI TAKASHI;SHIOZAWA TOSHIHIKO;KITAGAWA JUNICHI 发明人 KABE YOSHIRO;KOBAYASHI TAKASHI;SHIOZAWA TOSHIHIKO;KITAGAWA JUNICHI
分类号 H01L21/31 主分类号 H01L21/31
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