METHOD FOR DETERMINATION OF DEFECTS IN LAYER OF ELECTRIC INSULATION OF A CONDUCTOR

摘要

Method for determination of defects in a layer of electric insulation of a conductor that moves between the electrodes is realized through measurement of voltage drop in layer of electric insulation under investigation. One carries out simultaneously measurement of potential difference between capacitive sensors placed on the surface of the layer of electric insulation under investigation, at distance one from another that determines resolution of the defects revealed.