发明名称 CHIP TEST SYSTEM
摘要 A chip test system includes a digital control chip, a controller, and an indication circuit. A configuration file is burned into the digital control chip. The configuration file includes a first identification number. The controller reads the number from the configuration file and determines whether the number is the same as a predetermined identification number. If the numbers match, the controller outputs a first level signal to the indication circuit. If the numbers do not match, the controller outputs a second level signal to the indication circuit.
申请公布号 US2013032633(A1) 申请公布日期 2013.02.07
申请号 US201113305047 申请日期 2011.11.28
申请人 HON HAI PRECISION INDUSTRY CO., LTD.;HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD.;FU YING-BIN;FENG LAN-YI;PAN YA-JUN 发明人 FU YING-BIN;FENG LAN-YI;PAN YA-JUN
分类号 G06F17/00 主分类号 G06F17/00
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