发明名称 FORMING SIC MOSFETS WITH HIGH CHANNEL MOBILITY BY TREATING THE OXIDE INTERFACE WITH CESIUM IONS
摘要 Methods of forming a semiconductor structure include providing an insulation layer on a semiconductor layer and diffusing cesium ions into the insulation layer from a cesium ion source outside the insulation layer. A MOSFET including an insulation layer treated with cesium ions may exhibit increased inversion layer mobility.
申请公布号 WO2013019334(A1) 申请公布日期 2013.02.07
申请号 WO2012US43699 申请日期 2012.06.22
申请人 CREE, INC.;AUBURN UNIVERSITY;DHAR, SARIT;RYU, SEI-HYUNG;AGARWAL, ANANT;WILLIAMS, JOHN ROBERT 发明人 DHAR, SARIT;RYU, SEI-HYUNG;AGARWAL, ANANT;WILLIAMS, JOHN ROBERT
分类号 H01L21/00 主分类号 H01L21/00
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