发明名称 ION IMMOBILIZATION METHOD AND ION DISTRIBUTION STATE MEASURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To solve a problem of conventional methods in which it is difficult to be applied to a sample whose ion distribution state changes in a short time after external field is blocked, because a state of the sample still changes after the external field is blocked. <P>SOLUTION: An ion immobilization method includes a step of measuring a measuring object using a surface analyzer in a state where movement of an ion is suppressed by forming a metal film with a thickness of 10nm or less on the measuring object of a high polymer material containing an ionizing substance. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013029360(A) 申请公布日期 2013.02.07
申请号 JP20110164379 申请日期 2011.07.27
申请人 CANON INC 发明人 ITO SATOKO
分类号 G01N1/28;G01N23/223;G01N23/227;G01N27/62 主分类号 G01N1/28
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