发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME |
摘要 |
<p>Provided are: a semiconductor device which is capable of reducing the processes or reducing the area of a variable resistance element as much as possible; and a method for manufacturing the semiconductor device. A semiconductor device, which comprises two or more variable resistance elements (100) inside a multilayer wiring layer on a semiconductor substrate (101), and wherein: each variable resistance element (100) has a configuration in which a variable resistance layer (111) having a variable resistance is interposed between a lower electrode (105) and an upper electrode (112); a wiring line in a predetermined wiring layer in the multilayer wiring layer also serves as the lower electrode (105); and the upper electrode (112) is formed as a line that extends in one direction and also serves as an upper electrode of another variable resistance element that is adjacent to the variable resistance element (100) in the above-mentioned one direction.</p> |
申请公布号 |
WO2013018842(A1) |
申请公布日期 |
2013.02.07 |
申请号 |
WO2012JP69627 |
申请日期 |
2012.08.01 |
申请人 |
NEC CORPORATION;SAKAMOTO, TOSHITSUGU;TADA, MUNEHIRO;MIYAMURA, MAKOTO |
发明人 |
SAKAMOTO, TOSHITSUGU;TADA, MUNEHIRO;MIYAMURA, MAKOTO |
分类号 |
H01L27/105;H01L45/00;H01L49/00 |
主分类号 |
H01L27/105 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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