| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a function verification device for semiconductor integrated circuit and a function verification method for semiconductor integrated circuit that can reduce a development period and lower development costs. <P>SOLUTION: The function verification device for semiconductor integrated circuit includes: a stimulus generation part 321 which generates a stimulus according to a test scenario 31; a result determination part 323 which compares an output value obtained from a logic circuit 322 with an expectation value, and determines whether they match with each other; a Fail log generation part 326 which outputs mismatching information as a Fail log 34 when it is determined that the output value and expectation value do not mach with each other; a state dumping part 324 which saves values of all signals, registers and storage elements in the logic circuit 322 in a logic circuit state information storage part 33; and a state loading part 325 which loads the logic circuit state information saved in the logic circuit state information storage part 33 to the logic circuit 322 when it is determined that the output value and expectation value do not match with each other. <P>COPYRIGHT: (C)2013,JPO&INPIT |
