| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a device for measuring wavelength distribution which is improved in measurement accuracy by equalizing a substantially parallel light flux emitted from a region to be measured on a light receiving surface including a peripheral part of the light receiving surface. <P>SOLUTION: In a device 24 for measuring wavelength distribution, light flux emitted from a region 11 to be measured is diffused by a diffuser 52, a light flux equalizing optical element 53 makes at least a part of the light flux diffused by the diffuser 52 reflected by a side surface 53b so as to approach in the direction perpendicular to a light receiving surface of a light receiving part 56 and guides the light flux to the light receiving surface, and the light flux is detected by a plurality of light receiving elements of the light receiving part 56 having spectral sensitivity characteristics different from each other. <P>COPYRIGHT: (C)2013,JPO&INPIT |
