发明名称 |
X-RAY ANALYZER AND X-RAY ANALYSIS METHOD |
摘要 |
An X-ray analyzer (1) includes: a transmission X-ray inspecting portion (10) including: a first X-ray source (12); and a transmission X-ray detector (14) for detecting a transmission X-ray (12x) having passed through a sample (100) from the first X-ray source; a fluorescent X-ray inspecting portion (20) including: a second X-ray source (22); and a fluorescent X-ray detector (24) for detecting a fluorescent X-ray (22y) output from the sample when the sample is irradiated with an X-ray from the second X-ray source; a movement mechanism (30) for moving a sample stage (50); a foreign matter position calculating unit (60) for calculating a position of a foreign matter (101); and a movement mechanism control unit (61) for controlling the movement mechanism so that the position of the foreign matter calculated by the foreign matter position calculating unit coincides with an optical axis (22c) of the second X-ray source.
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申请公布号 |
US2013034204(A1) |
申请公布日期 |
2013.02.07 |
申请号 |
US201213564800 |
申请日期 |
2012.08.02 |
申请人 |
MATOBA YOSHIKI;NAKATANI RINTARO;SATO TSUNEO |
发明人 |
MATOBA YOSHIKI;NAKATANI RINTARO;SATO TSUNEO |
分类号 |
G01N23/223;G01N23/06 |
主分类号 |
G01N23/223 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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