发明名称 X-RAY SPECTROSCOPIC SYSTEM AND X-RAY ANALYZER
摘要 <P>PROBLEM TO BE SOLVED: To provide an X-ray spectroscopic system capable of easily selecting and extracting multi-wavelength X-rays with wavelength in a prescribed wavelength range from white X-rays with continuous wavelength. <P>SOLUTION: An X-ray spectroscopic system comprises an X-ray wave guide that white X-rays enter, and X-ray selection means that separates diffracted X-rays, with different diffraction angles, which leave the X-ray wave guide, and that selects and extracts multi-wavelength X-rays in a prescribed wavelength range from the diffracted X-rays. The X-ray wave guide has a core and a clad. The core is formed of a periodic structure in which a basic structure including a plurality of substances having different real parts of refractive indexes shows periodicity. The total reflection critical angle of the X-rays at the interface between the clad and the core is greater than Bragg angles due to the periodicity of the basic structure of the periodic structure of the core. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013029454(A) 申请公布日期 2013.02.07
申请号 JP20110166802 申请日期 2011.07.29
申请人 CANON INC 发明人 TAKAMOTO ATSUSHI;OKAMOTO KOHEI;MIYATA HIROKATSU
分类号 G21K1/06;G01N23/201;G21K1/00 主分类号 G21K1/06
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