发明名称 DETERMINING THIN FILM STACK FUNCTIONAL RELATIONSHIPS FOR MEASUREMENT OF CHEMICAL COMPOSITION
摘要 <p>A method for determining chemical composition from optical properties of a stack formed with a process, by preparing test samples of the stack using known and intentional variations to the process to affect a variation in the chemical composition, measuring the optical properties of the test samples, measuring the chemical composition of the test samples, performing a processor-based regression analysis to determine an optical state function including correlations between the optical properties of the test samples and the chemical composition of the test samples, fabricating production samples of the stack using the process, measuring the optical properties of the production samples, and estimating the chemical composition of the production samples using the optical state function.</p>
申请公布号 WO2013019349(A1) 申请公布日期 2013.02.07
申请号 WO2012US44694 申请日期 2012.06.28
申请人 KLA-TENCOR CORPORATION;YGARTUA, CARLOS L. 发明人 YGARTUA, CARLOS L.
分类号 G01N21/00;G01N21/17;G01N21/41 主分类号 G01N21/00
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