发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
<p>A semiconductor device and a method for manufacturing the same are provided. The method includes that a tunneling dielectric layer (120), a storage medium layer (130), a gate dielectric layer (140) and a gate layer (150) are sequentially formed on a semiconductor substrate (1) of a first semiconductor material. The tunneling dielectric layer (120), the storage medium layer (130), the gate dielectric layer (140) and the gate layer (150) are patterned to form a gate stack. Grooves (103) are formed in the semiconductor substrate (1) on two sides of the gate stack. A second semiconductor material different from the first semiconductor material is filled in the grooves (103), and the whole device is covered with a dielectric layer (180). A surface energy level of a channel is subject to a stress generated by the second semiconductor material and covering the dielectric layer (180) and is changed, a tunneling current is increased, and the storing effect of the device is improved.</p> |
申请公布号 |
WO2013016853(A1) |
申请公布日期 |
2013.02.07 |
申请号 |
WO2011CN01980 |
申请日期 |
2011.11.28 |
申请人 |
INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES;YIN, HUAXIANG;XU, QIUXIA;CHEN, DAPENG |
发明人 |
YIN, HUAXIANG;XU, QIUXIA;CHEN, DAPENG |
分类号 |
H01L21/336;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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