发明名称 |
Nonvolatile Semiconductor Memory Device and Manufacturing Method Thereof |
摘要 |
<p>A nonvolatile semiconductor memory device (100) comprises a substrate (102) provided with a transistor (101); a first interlayer insulating layer (103) formed over the substrate to cover the transistor; a first contact plug (104) formed in the first interlayer insulating layer and electrically connected to either of a drain electrode (101a) or a source electrode (101b) of the transistor, and a second contact plug (105) formed in the first interlayer insulating layer and electrically connected to the other of the drain electrode or the source electrode of the transistor; a resistance variable layer (106) formed to cover a portion of the first contact plug; a first wire (107) formed on the resistance variable layer; and a second wire (108) formed to cover a portion of the second contact plug; an end surface of the resistance variable layer being coplanar with an end surface of the first wire.
</p> |
申请公布号 |
EP2447996(A3) |
申请公布日期 |
2013.02.06 |
申请号 |
EP20120152973 |
申请日期 |
2009.02.09 |
申请人 |
PANASONIC CORPORATION |
发明人 |
MIKAWA TAKUMI;KAWASHIMA, YOSHIO;ARITA, KOJI;NINOMIYA, TAKEKI |
分类号 |
H01L27/10 |
主分类号 |
H01L27/10 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|