发明名称 Nonvolatile Semiconductor Memory Device and Manufacturing Method Thereof
摘要 <p>A nonvolatile semiconductor memory device (100) comprises a substrate (102) provided with a transistor (101); a first interlayer insulating layer (103) formed over the substrate to cover the transistor; a first contact plug (104) formed in the first interlayer insulating layer and electrically connected to either of a drain electrode (101a) or a source electrode (101b) of the transistor, and a second contact plug (105) formed in the first interlayer insulating layer and electrically connected to the other of the drain electrode or the source electrode of the transistor; a resistance variable layer (106) formed to cover a portion of the first contact plug; a first wire (107) formed on the resistance variable layer; and a second wire (108) formed to cover a portion of the second contact plug; an end surface of the resistance variable layer being coplanar with an end surface of the first wire. </p>
申请公布号 EP2447996(A3) 申请公布日期 2013.02.06
申请号 EP20120152973 申请日期 2009.02.09
申请人 PANASONIC CORPORATION 发明人 MIKAWA TAKUMI;KAWASHIMA, YOSHIO;ARITA, KOJI;NINOMIYA, TAKEKI
分类号 H01L27/10 主分类号 H01L27/10
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