发明名称 Method of balancing multilayer substrate stress and multilayer substrate
摘要 Disclosed is a method to decrease warpage of a multi-layer substrate, comprises a first metal layer and a second metal layer. First area of the first metal layer is larger than second area of the second metal layer. In the same layer of the second metal layer, a redundant metal layer can be set to make a redundant metal layer area plus the second area considerably equivalent to the first area. Alternatively, a redundant space can be set in the first metal layer to achieve the same result. When the multi-layer substrate comprises a first dielectric layer with an opening and a second dielectric layer, a redundant opening positioned corresponding to the opening can be set in the second dielectric layer. The present invention employs a method of balancing the multi-layer substrate stress, i.e. to homogenize the multi-layer structure composed of different metal layers and dielectric layers to decrease warpage thereof.
申请公布号 KR101229956(B1) 申请公布日期 2013.02.06
申请号 KR20107018159 申请日期 2008.03.31
申请人 发明人
分类号 B32B9/00 主分类号 B32B9/00
代理机构 代理人
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