发明名称 Method for testing and configuring systems in integrated circuits and arrangement for carrying out the method
摘要 The invention relates to a redundantly designed arrangement which passes through a test and configuration phase before the actual operation. For this purpose, it exhibits a number of test modules (3) connected to one another via a serial test bus (5), which modules test themselves in the initial test phase. They are also responsible for testing the test bus (5), a system bus (6) connecting the system modules (1), and crossbar distributors (2, 2a). For the system to operate, the required modules and bus lines operating correctly are connected together and the remaining ones are disconnected. <IMAGE>
申请公布号 DE3430168(A1) 申请公布日期 1986.02.27
申请号 DE19843430168 申请日期 1984.08.16
申请人 SIEMENS AG 发明人 FEGER,OTMAR
分类号 G06F11/16;G06F11/22;(IPC1-7):G01R31/28;G06F11/08 主分类号 G06F11/16
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