发明名称 X-ray inspection equipment
摘要 PURPOSE: An X-ray examination apparatus is provided to miniaturize by reducing a size and to provide the convenience for a user with a simple constitution. CONSTITUTION: An X-ray examination apparatus(100) comprises an y-axis convey part(20), an x-axis convey part(30), a z-axis convey part(40), an object fixing and inspecting part(50), an X-ray tube(60), and a detector(70). The y-axis convey part is composed of a y driving shaft and moving body(22). The x-axis convey part is composed of a fixing body(31), a convey hole(32), and a fixing unit. The z-axis convey part is composed of a z driving shaft(42) and a convey body. The object fixing and inspecting part is composed of a moving unit, a tilt inspecting plate(52), a fixing inspecting plate(53), a jig(54), and a first driving unit. The X-ray tube is installed in one side of the object fixing and inspecting part and a frame(10). The detector is installed in the other side of the object fixing and inspecting part and the frame.
申请公布号 KR101224883(B1) 申请公布日期 2013.02.06
申请号 KR20100124034 申请日期 2010.12.07
申请人 发明人
分类号 G01B15/06;G01N23/18 主分类号 G01B15/06
代理机构 代理人
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