发明名称 Plasma cleaning method and plasma CVD method
摘要 A plasma cleaning method is performed in a plasma CVD apparatus for depositing a silicon nitride film on a surface of a target substrate, and includes a stage (S1) of supplying a cleaning gas containing NF3 gas into a process container, thereby removing extraneous deposits formed on portions inside the process container; a stage (S2) of supplying a gas containing hydrogen gas into the process container and generating plasma thereof, thereby removing residual fluorine inside the process container; and a stage (S3) of supplying a gas containing a rare gas into the process container and generating plasma thereof, thereby removing residual hydrogen inside the process container.
申请公布号 US8366953(B2) 申请公布日期 2013.02.05
申请号 US20070441828 申请日期 2007.09.18
申请人 TOKYO ELECTRON LIMITED;KOHNO MASAYUKI;NISHITA TATSUO;NAKANISHI TOSHIO 发明人 KOHNO MASAYUKI;NISHITA TATSUO;NAKANISHI TOSHIO
分类号 B44C1/22;C03C15/00;G01L21/30;G01R31/00;H01L21/302;H01L21/461 主分类号 B44C1/22
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