发明名称 Semiconductor structure and method for manufacturing the same
摘要 The present application discloses a semiconductor structure and a method for manufacturing the same. The semiconductor structure according to the present invention adjusts a threshold voltage with a common contact, which has a portion outside the source or drain region extending to the back-gate region and provides an electrical contact of the source or drain region and the back-gate region, which leads to a simple manufacturing process, an increased integration level and a lowered manufacture cost. Moreover, the asymmetric design of the back-gate structure further increases the threshold voltage and improves the performance of the device.
申请公布号 US8367490(B2) 申请公布日期 2013.02.05
申请号 US201113144182 申请日期 2011.03.04
申请人 INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES;ZHU HUILONG;LIANG QINGQING;YIN HAIZHOU;LUO ZHIJIONG 发明人 ZHU HUILONG;LIANG QINGQING;YIN HAIZHOU;LUO ZHIJIONG
分类号 H01L27/12;H01L21/84 主分类号 H01L27/12
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