发明名称 Memory word line boost using thin dielectric capacitor
摘要 A memory includes a word line and a word line boost circuit. The word line boost circuit includes a capacitor having a capacitor dielectric thickness, and a transmission gate coupled to the word line and the capacitor. The transmission gate has a gate-dielectric thickness that is greater than the capacitor dielectric thickness. The word line boost circuit is configured to supply a high voltage that is higher than a power supply voltage to the word line during an operation of the memory by utilizing the capacitor.
申请公布号 US8369180(B2) 申请公布日期 2013.02.05
申请号 US20100949261 申请日期 2010.11.18
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.;YU HUNG-CHANG;CHIH YUE-DER 发明人 YU HUNG-CHANG;CHIH YUE-DER
分类号 G11C8/00 主分类号 G11C8/00
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