发明名称 Resistive memory employing different pulse width signals for reading different memory cells
摘要 A semiconductor memory includes a memory cell array including a plurality of memory cells arranged in rows and columns, a plurality of bit lines, each bit line connected to a corresponding column of the memory cells; a column selection circuit configured to select at least one bit line in response to a column select signal; and a read circuit configured to precharge the selected bit line in response to a precharge signal, to apply a read bias to the precharged bit line in response to a read bias provision signal, and to read data from the memory cells. A resistance level of each of the memory cells varies according to data stored therein, and the read circuit reads data from a first memory cell of the plurality of memory cells in response to the precharge signal having a first pulse width and reads data from a second memory cell of the plurality of memory cells in response to the precharge signal having a second pulse width.
申请公布号 US8369136(B2) 申请公布日期 2013.02.05
申请号 US20100662985 申请日期 2010.05.14
申请人 SAMSUNG ELECTRONICS CO., LTD.;CHOI BYUNG-GIL 发明人 CHOI BYUNG-GIL
分类号 G11C11/00 主分类号 G11C11/00
代理机构 代理人
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