发明名称 PHOSPHORESCENCE MEASURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a simple phosphorescence measuring method which allows troublesome separation of fluorescence and phosphorescence to be accurately performed based on a conventional measurement method at low temperature without new modification of a device. <P>SOLUTION: A phosphorescence measuring method comprises the steps of: sequentially irradiating an object to be measured with two excitation lights having different output intensity, sequentially detecting two kinds of data (emission intensity versus wavelength) for the light emitted from the object to be measured, calculating two kinds of normalized data through normalization processing on the basis of the maximum emission intensity of the respective data, and detecting the phosphorescence spectrum of the object to be measured by obtaining the absolute value of difference between the two kinds of normalized data. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013024570(A) 申请公布日期 2013.02.04
申请号 JP20110156274 申请日期 2011.07.15
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 WATABE GOKICHI
分类号 G01N21/64 主分类号 G01N21/64
代理机构 代理人
主权项
地址