发明名称
摘要 <p>Correction of skew in plasma etch rate distribution is performed by tilting the overhead RF source power applicator about a tilt axis whose angle is determined from skew in processing data. Complete freedom of movement is provided by incorporating exactly three axial motion servos supporting a floating plate from which the overhead RF source power applicator is suspended.</p>
申请公布号 JP2013504159(A) 申请公布日期 2013.02.04
申请号 JP20120527874 申请日期 2010.06.11
申请人 发明人
分类号 H05H1/46;H01L21/3065 主分类号 H05H1/46
代理机构 代理人
主权项
地址