| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a dummy chip which allows for relatively inexpensive and highly accurate attachment accuracy inspection, and to provide an attachment accuracy inspection method. <P>SOLUTION: A dummy chip 110 has such a shape as one peripheral line 118 larger than at least one of a sucked face 112 and an attachment face 114 is viewed as a contour, both when viewed from the sucked face side and when viewed from the attachment face side, and inspection related to the attachment accuracy of an electrical component attachment machine is performed using the dummy chip. Since the imaging data of the dummy chip obtained by imaging from the sucked face side matches the imaging data of the dummy chip obtained by imaging from the attachment face side for the shape of the dummy chip, without enhancing the manufacturing accuracy of the dummy chip extremely, relatively inexpensive and highly accurate attachment accuracy inspection can be carried out. <P>COPYRIGHT: (C)2013,JPO&INPIT |
