| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit and the like in which a plurality of parallel/serial conversion circuits can be tested securely in small circuit scale. <P>SOLUTION: A semiconductor integrated circuit comprises first and second parallel/serial conversion circuits, a test parallel data stream generation circuit which generates first and second test parallel data streams, and a detection circuit which detects whether first and second serial data bits converted by the first and second parallel/serial conversion circuits are matched or not. In the semiconductor integrated circuit, the test parallel data stream generation circuit includes a parallel bit shift circuit which shifts bits of parallel data constituting a common test parallel data stream just by the first number of bits to generate a second test parallel data stream, and the detection circuit includes a serial bit shift circuit which shifts bits of either the first serial data or the second serial data to match the timing to input the first and second serial data to a comparator circuit. <P>COPYRIGHT: (C)2013,JPO&INPIT |
