发明名称 Methods of Fabricating Semiconductor Devices
摘要 A method of fabricating a semiconductor device using a recess channel array is disclosed. A substrate is provided having a first region and a second region, including a first transistor in the first region including a first gate electrode partially filling a trench, and source and drain regions that are formed at both sides of the trench, and covered by a first insulating layer. A first conductive layer is formed on the substrate. A contact hole through which the drain region is exposed is formed by patterning the first conductive layer and the first insulating layer. A contact plug is formed that fills the contact hole. A bit line is formed that is electrically connected to the drain region through the contact plug, and simultaneously a second gate electrode is formed in the second region by patterning the first conductive layer.
申请公布号 US2013026564(A1) 申请公布日期 2013.01.31
申请号 US201213644166 申请日期 2012.10.03
申请人 SAMSUNG ELECTRONICS CO., LTD.;SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO KWAN-SIK;CHUN KWANG-YOUL;YOON JAE-MAN;KIM BONG-SOO
分类号 H01L27/088;H01L29/78 主分类号 H01L27/088
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