| 摘要 |
<P>PROBLEM TO BE SOLVED: To solve such a problem that the reliability of a multilayer ceramic electronic component, such as BDV, may degrade when a dummy conductor is formed in an outer layer where any internal electrode does not exist in order to achieve more reliable plating growth when a plating film is precipitated in an exposed part of the internal electrode. <P>SOLUTION: A plurality of outer layer dummy groups 31 are formed by arranging two or more outer layer dummy conductors 7 in the height direction continuously at predetermined intervals. When the interval of the outer layer dummy conductors 7 in the outer layer dummy group 31 represents d, and the interval of the outer layer dummy groups 31 represents g, g is set larger than d. Since the interval of the outer layer dummy groups 31 is increased while ensuring the plating precipitation point, pressing force of the internal electrodes 3, 4 by the outer layer dummy conductors 7 can be relaxed, the distance between the internal electrodes can be locally prevented from shortening, and thereby the BDV can be prevented from degrading. <P>COPYRIGHT: (C)2013,JPO&INPIT |
