发明名称 RESISTIVE MEMORY ARRAY AND METHOD FOR CONTROLLING OPERATIONS OF THE SAME
摘要 A resistive memory and a method for controlling operations of the resistive memory are provided. The resistive memory has a first memory layer, a second memory layer and a medium layer. Each of the first memory layer and the second memory layer is used to store data. The medium layer is formed between the first memory layer and the second memory layer. The method comprises at least a step of measuring a resistance between the first memory layer and the second memory layer, and determining which one of a first state, a second state and a third state is a state of the resistive memory according to the measured resistance. A resistive memory array including an array of the above resistive memory units, word lines and bit lines is also described, wherein the word (bit) lines are coupled to the first (second) memory layers.
申请公布号 US2013028005(A1) 申请公布日期 2013.01.31
申请号 US201213624761 申请日期 2012.09.21
申请人 MACRONIX INTERNATIONAL CO., LTD.;MACRONIX INTERNATIONAL CO., LTD. 发明人 CHIEN WEI-CHIH;LEE MING-HSIU;LEE FENG-MING
分类号 G11C11/21;H01L45/00 主分类号 G11C11/21
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