发明名称 SPLIT-GATE FLASH MEMORY EXHIBITING REDUCED INTERFERENCE
摘要 A split gate memory cell is fabricated with a dielectric spacer comprising a high-k material between the word gate and the memory gate stack. Embodiments include memory cells with a dielectric spacer comprising low-k and high-k layers. Other embodiments include memory cells with an air gap between the word gate and the memory gate stack.
申请公布号 US2013026552(A1) 申请公布日期 2013.01.31
申请号 US201113189964 申请日期 2011.07.25
申请人 GLOBALFOUNDRIES SINGAPORE PTE. LTD.;TOH ENG HUAT;TAN SHYUE SENG (JASON);QUEK ELGIN 发明人 TOH ENG HUAT;TAN SHYUE SENG (JASON);QUEK ELGIN
分类号 H01L21/28;H01L29/788 主分类号 H01L21/28
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