发明名称 DETECTOR FOR USE IN CHARGED PARTICLE APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a silicon drift diode detector for use in a charged particle apparatus available even for high count rate measurement. <P>SOLUTION: A detector comprises: a SDD 200; an amplifier 206; and a feedback element in a form of, for example, a resistor 208 or a diode, switchably connected to the output of the amplifier 206. When the feedback element is selected via a switch 209, the detector 206 operates in a current measurement mode for determining electron current. When the feedback element is not selected, the detector 206 operates in a pulse height measurement mode for determining the energy of X-ray quanta. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013019897(A) 申请公布日期 2013.01.31
申请号 JP20120152136 申请日期 2012.07.06
申请人 FEI CO 发明人 CORNELIS SANDER KOOIJMAN;HERALD NICOLAAS ANNE VAN FEEN
分类号 G01T1/24 主分类号 G01T1/24
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