发明名称 DRY ETCHING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a dry etching method for readily providing top rounds at trenches and vias formed by removal of a dummy material. <P>SOLUTION: A dry etching method for forming trenches or vias by removing a dummy material with its periphery surrounded by an interlayer oxide film includes the steps of etching the dummy material to a predetermined depth, performing isotropic etching after the dummy material etching, and removing remaining part of the dummy material after the isotropic etching. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013021197(A) 申请公布日期 2013.01.31
申请号 JP20110154408 申请日期 2011.07.13
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 ICHIMARU TOMOYOSHI;KUWABARA KENICHI;SAITO TAKESHI
分类号 H01L21/3065;H01L21/28;H01L21/336;H01L21/76;H01L21/768;H01L29/423;H01L29/49;H01L29/78 主分类号 H01L21/3065
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