发明名称 Method for manufacturing e.g. application-specific integrated circuit for P-channel complementary metal oxide semiconductor transistor, involves forming electrode structures with electrode materials and insulation layers
摘要 <p>The method involves removing a hard mask using etching process and an etching mask covering an active region (202a). Gate electrode structures (230a, 230b) of transistors (250a, 250b) are respectively formed over the active region and another active region (202b) according to removal of the etching mask. The gate electrode structures are provided with metal-containing gate electrode materials (233a) and gate insulation layers (232a) with a dielectric material. Surface treatment is made using a mixture of hydrochloric acid and hydrogen peroxide.</p>
申请公布号 DE102011079836(A1) 申请公布日期 2013.01.31
申请号 DE20111079836 申请日期 2011.07.26
申请人 GLOBALFOUNDRIES INC. 发明人 KRONHOLZ, STEPHAN-DETLEF;JAVORKA, PETER;WIATR, MACIEJ
分类号 H01L21/8238;H01L21/308;H01L21/316;H01L27/092 主分类号 H01L21/8238
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