发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor image sensor having a photodiode, which enables microfabrication of a semiconductor device by achieving higher light detection efficiency and stabilizing characteristics of pixel transistors other than light detection parts, which perform signal processing. <P>SOLUTION: By forming carbon injection layers 128a, 128b by performing joint injection of carbon in a P<SP POS="POST">+</SP>region 126 and an N type region 111, which compose a photodiode PD, capacitance of the photodiode PD is increased. Further, by uniformizing boron distribution in a channel of a transfer transistor Tr including the N type region 111 based on forming of the carbon injection layer 128b and stabilizing characteristics of the transfer transistor Tr, an occurrence of variation in characteristics of elements in a semiconductor device is prevented. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013020998(A) 申请公布日期 2013.01.31
申请号 JP20110150573 申请日期 2011.07.07
申请人 RENESAS ELECTRONICS CORP 发明人 NISHIDA AKIO
分类号 H01L27/146;H01L21/265;H01L21/76;H01L21/8234;H01L21/8238;H01L27/06;H01L27/092;H01L31/10 主分类号 H01L27/146
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