发明名称 METHODS AND APPARATUS FOR FORMING SEMICONDUCTOR STRUCTURES
摘要 Methods and apparatus for forming semiconductor structures are disclosed herein. In some embodiments, a semiconductor structure may include a first germanium carbon layer having a first side and an opposing second side; a germanium-containing layer directly contacting the first side of the first germanium carbon layer; and a first silicon layer directly contacting the opposing second side of the first germanium carbon layer. In some embodiments, a method of forming a semiconductor structure may include forming a first germanium carbon layer atop a first silicon layer; and forming a germanium-containing layer atop the first germanium carbon layer.
申请公布号 US2013026540(A1) 申请公布日期 2013.01.31
申请号 US201113218782 申请日期 2011.08.26
申请人 APPLIED MATERIALS, INC.;SANCHEZ ERROL ANTONIO C.;HUANG YI-CHIAU 发明人 SANCHEZ ERROL ANTONIO C.;HUANG YI-CHIAU
分类号 H01L29/78;H01L21/20 主分类号 H01L29/78
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