发明名称 PROGRAM, TEST APPARATUS AND TESTING METHOD
摘要 A recording medium has a program recorded to operate a testing apparatus for testing an electronic device. The program causes the testing apparatus to perform functions as a comparing unit for comparing an output signal from the electronic device with an expected value, a timing generating unit for generating a rate signal and providing the comparing unit with the rate signal, wherein the rate signal determines timing at which the comparing unit compares the output signal with the expected value, a fail memory for saving the comparison results obtained by comparing the output signal with the expected value successively according to the rate signal to different addresses, and a period calculating unit for calculating a period of the output signal based on the comparison results stored successively in the fail memory, when executing a test for measuring the period of the output signal.
申请公布号 KR101228167(B1) 申请公布日期 2013.01.30
申请号 KR20077009216 申请日期 2005.09.30
申请人 发明人
分类号 G01R31/28;G01R31/3183 主分类号 G01R31/28
代理机构 代理人
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