Device and method for testing a storage of an electronic device

摘要

The device (1) has a memory (2) that is coupled with control device (4) for controlling electric appliance. The memory is coupled with testing device (5) for testing a determined memory cell (6) from several memory cells of memory. An intermediate memory (7) is provided for temporarily storing in determined memory cell of stored data at the time of testing the determined memory cell. An address converter (8) is provided for converting address of determined memory cell in the address of intermediate memory at the time of testing the determined memory cell. An independent claim is included for a method for testing memory of electric appliance.