发明名称 Plasma radiation source, method of forming plasma radiation, apparatus for projecting a pattern from a patterning device onto a substrate and device manufacturing method
摘要 A patterned beam of radiation is projected onto a substrate. A reflective optical element is used to help form the radiation beam from radiation emitted from a plasma region of a plasma source. In the plasma source, a plasma current is generated in the plasma region. To reduce damage to the reflective optical element, a magnetic field is applied in the plasma region with at least a component directed along a direction of the plasma current. This axial magnetic field helps limit the collapse of the Z-pinch region of the plasma. By limiting the collapse, the number of fast ions emitted may be reduced.
申请公布号 US8362444(B2) 申请公布日期 2013.01.29
申请号 US20100907135 申请日期 2010.10.19
申请人 ASML NETHERLANDS B.V.;IVANOV VLADIMIR VITALEVITCH;BANINE VADIM YEVGENYEVICH;KOSHELEV KONSTANTIN NIKOLAEVITCH 发明人 IVANOV VLADIMIR VITALEVITCH;BANINE VADIM YEVGENYEVICH;KOSHELEV KONSTANTIN NIKOLAEVITCH
分类号 G21K5/00 主分类号 G21K5/00
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